Technology at the heart of our solution

A unique deeptech measuring device, combining two technological pillars for accurate, fast, and comprehensive surface inspection.

Nonlinear Reflectometry

Nonlinear optics, and specifically second harmonic generation (SHG), allow materials to be analysed in a different way, in particular by detecting contaminants and residual charges.

Used in reflection mode, this non-destructive and extremely sensitive technique provides rapid access to essential information that is often inaccessible using traditional analysis methods.

Nonlinear Ellipsometry

Polarisation of light, a key concept in ellipsometry, makes it possible to characterise sensitive interfaces or detect very subtle changes in matter. In nonlinear ellipsometry, this sensitivity is amplified, enabling even more subtle detection.

Integrated into our R-SHG inspection solution, this approach reveals surface anisotropy and even detects molecular monolayers.

Nonlinear Reflectometry

Nonlinear optics, and specifically second harmonic generation (SHG), allow materials to be analysed in a different way, in particular by detecting contaminants and residual charges.

Used in reflection mode, this non-destructive and extremely sensitive technique provides rapid access to essential information that is often inaccessible using traditional analysis methods.

Nonlinear Ellipsometry

Polarisation of light, a key concept in ellipsometry, makes it possible to characterise sensitive interfaces or detect very subtle changes in matter. In nonlinear ellipsometry, this sensitivity is amplified, enabling even more subtle detection.

Integrated into our R-SHG inspection solution, this approach reveals surface anisotropy and even detects molecular monolayers.