First NDT solution
suitable for
LiNbO₃
Advanced non-destructive metrology solutions to ensure reliability and performance of photonic and semiconductor components, specifically designed for Lithium Niobate (LiNbO₃).
Lithium Niobate : An exceptional
optical material
Lithium niobate (LiNbO₃) is a ferroelectric crystal particularly recognized for its exceptional nonlinear optical and electro-optical properties . In addition, it is seeing increasing adoption in the semiconductor industry. Indeed, its unique characteristics make it a key material for the technologies of tomorrow.
Why choose Lithium niobate ?
First, for its ultra-fast modulation: it allows the design of optical modulators that are much faster and more efficient than those made of silicon, which is essential for telecommunications and quantum optics.
Then, thanks to its wide bandwidth : lithium niobate becomes essential for 6G and advanced optical communication systems.
Furthermore, its excellent integrability on chip : it facilitates miniaturization and opens the way to high-performance photonic circuits.
Finally, its role in quantum applications: LiNbO₃ is a technological key for future next-generation quantum computers and sensors.


Technological innovation serving your sectors of activity
Integrated photonics
Integrated photonics relies on miniaturized optical systems incorporating advanced components such as waveguides, diffraction gratings, and phase modulators. However, these devices are sensitive to even the slightest irregularity. That’s why NLOPTICS detects defects accurately and reliably.
Our applications
- Quality control of periodic structures for quasi-phase matching in RF modulators
- Evaluation of planar waveguide microstructures to validate manufacturing steps
- Identification of optical axes to improve signal propagation efficiency
- Validation of surface quality by excluding topology effects
Semiconductors
NLOPTICS meticulously analyzes material surfaces and thin films to ensure optimal performance in the manufacturing of advanced semiconductor components. These components are used in devices such as microchips, optical modulators, and CCD sensors.
Our applications
- Stoichiometric evaluation of thin layers to certify deposition quality
- Analysis of wafers and semiconductor materials (SiO2, InP, GaAs, LiNbO3, SiC, GaN, Sapphire, Diamond, and more)
- Certification of nonlinear response performance on thin film deposits
Glasses and Polymers
At all scales, glasses and polymers used in optics, automotive, and electronics require careful inspection to ensure the performance of coatings, deposits, thin films, and polymer components on the surface.
Our applications
- Detection of molecular monolayers for sensor manufacturing, particularly on flat surfaces and optical fibers
- Evaluation of the degree of surface isotropy to certify the amorphous character of glasses in advanced optics
- Characterization of the optical quality of glasses by the detection of static residual charges
Beyond products, we offer you innovative and tailor-made solutions
Focus on a personalized approach to meet your needs.
Recognized expertise
At NLOPTICS , we continually invest in research and development. Our goal is to improve our technologies and expand the capabilities of our measuring devices.
We also collaborate closely with industrial and academic partners to stay at the forefront of innovation in non-destructive metrology.
























Upcoming events
Join us at our upcoming events to discover our tailor-made solutions.

Laser World of Photonics
24 and 27 June 2025 – Munich, Germany

Forum Adhérents Alpha RLH
5 june 2025 - Blanquefort Bordeaux, France

Photonix Tech
02 et 03 avril 2025 Parc des Exposition - Chartres, France

ECS Brokerage Event
18 and 19 february 2025 Le Plaza - Bruxelles, Belgium

ISLOP 2025
05 and 07 may 2025 Amsterdam, Netherlands
© 2025 – NLOPTICS. All rights reserved.
Terms of use
Privacy policy
Cookie policy