Technology
at the heart of
our solution

A unique DEEPTECH measuring device, merging two technological pillars for precise, fast and complete surface control.

Nonlinear Reflectometry

Nonlinear optics, and specifically second harmonic generation (SHG), allows you to analyze matter differently, detecting contaminants and residual charges.
By applying this reflected light effect, you obtain an ultra-sensitive and non-destructive technique that provides key information more easily and quickly than other methods.

Nonlinear Ellipsometry

Light polarization, a key concept in ellipsometry, allows us to characterize sensitive interfaces or detect very fine changes in matter. In nonlinear ellipsometry, this sensitivity is amplified, allowing even finer detection. By integrating this technique into our analysis tool, we are able to reveal the degree of surface isotropy, right up to the identification of molecular monolayers.

Nonlinear Reflectometry

Nonlinear optics, and specifically second harmonic generation (SHG), allows you to analyze matter differently, detecting contaminants and residual charges.
By applying this reflected light effect, you obtain an ultra-sensitive and non-destructive technique that provides key information more easily and quickly than other methods.

Nonlinear Ellipsometry

Light polarization, a key concept in ellipsometry, allows us to characterize sensitive interfaces or detect very fine changes in matter. In nonlinear ellipsometry, this sensitivity is amplified, allowing even finer detection.
By integrating this technique into our analysis tool, we are able to reveal the degree of surface isotropy, right up to the identification of molecular monolayers.